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Status and challenges of phase change memory modeling

Authors :
Lacaita, A.L.
Ielmini, D.
Mantegazza, D.
Source :
Solid-State Electronics. Sep2008, Vol. 52 Issue 9, p1443-1451. 9p.
Publication Year :
2008

Abstract

Abstract: Phase change memory (PCM) is the most performing non-volatile memory-technology alternative to FLASH. In order to design optimized cells, in term of geometry and materials, for present and future technological nodes, physics-based models for readout, programming and data retention are required. In this work, transport and phase-change modeling in PCM cell is reviewed and used to discuss (1) the programming-current reduction through geometry optimization, (2) the trade-off between programming current and readout resistance and (3) the program disturb phenomenon. In particular, scaling of PCM is extensively investigated, comparing the impact of isotropic and non-isotropic scaling on cell programming-current and program-disturb. Recent developments and open issues in PCM physical modeling are finally presented. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00381101
Volume :
52
Issue :
9
Database :
Academic Search Index
Journal :
Solid-State Electronics
Publication Type :
Academic Journal
Accession number :
34091919
Full Text :
https://doi.org/10.1016/j.sse.2008.04.020