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Status and challenges of phase change memory modeling
- Source :
-
Solid-State Electronics . Sep2008, Vol. 52 Issue 9, p1443-1451. 9p. - Publication Year :
- 2008
-
Abstract
- Abstract: Phase change memory (PCM) is the most performing non-volatile memory-technology alternative to FLASH. In order to design optimized cells, in term of geometry and materials, for present and future technological nodes, physics-based models for readout, programming and data retention are required. In this work, transport and phase-change modeling in PCM cell is reviewed and used to discuss (1) the programming-current reduction through geometry optimization, (2) the trade-off between programming current and readout resistance and (3) the program disturb phenomenon. In particular, scaling of PCM is extensively investigated, comparing the impact of isotropic and non-isotropic scaling on cell programming-current and program-disturb. Recent developments and open issues in PCM physical modeling are finally presented. [Copyright &y& Elsevier]
- Subjects :
- *PHASE transitions
*GEOMETRY
*MATHEMATICAL optimization
*MATHEMATICAL programming
Subjects
Details
- Language :
- English
- ISSN :
- 00381101
- Volume :
- 52
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Solid-State Electronics
- Publication Type :
- Academic Journal
- Accession number :
- 34091919
- Full Text :
- https://doi.org/10.1016/j.sse.2008.04.020