Evaluation of electrode-semiconductor barrier in transparent top-contact polymer field effect transistors.

Interfacial barriers at the metal-semiconductor junction manifest in the form of sizable contact resistance in polymer field effect transistors (PFETs). We study the barrier using optical excitation directed specifically beneath the electrodes in the top-contact PFETs without optically perturbing the channel. Differences in the transconductance responses with the light localized at the source and the drain electrode region provides a considerable insight into the injection barriers. [ABSTRACT FROM AUTHOR]