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Self-assembled InGaN quantum dots on GaN emitting at 520nm grown by metalorganic vapor-phase epitaxy

Authors :
Ee, Yik-Khoon
Zhao, Hongping
Arif, Ronald A.
Jamil, Muhammad
Tansu, Nelson
Source :
Journal of Crystal Growth. Apr2008, Vol. 310 Issue 7-9, p2320-2325. 6p.
Publication Year :
2008

Abstract

Abstract: Self-assembled InGaN quantum dots (QDs) have been grown using metalorganic vapor-phase epitaxy (MOVPE), without using anti-surfactant. Using 120s annealing, InGaN QDs have been successfully formed with a circular base diameter of 40nm and an average height of 4nm, with QDs density of 4×109 cm−2. The InGaN QDs have peak photoluminescence (PL) wavelengths of 519 and 509nm for samples without and with a GaN upper barrier, respectively. The full-width half-maximum (FWHM) of the PL spectra ranges from 56.6 up to 69.6nm. These results demonstrates that high In-content InGaN QDs can be grown by MOVPE, and can potentially be utilized as the active media for light-emitting diodes (LEDs) and semiconductor laser diodes for green emission. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00220248
Volume :
310
Issue :
7-9
Database :
Academic Search Index
Journal :
Journal of Crystal Growth
Publication Type :
Academic Journal
Accession number :
31581815
Full Text :
https://doi.org/10.1016/j.jcrysgro.2007.12.022