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Raman scattering and X-ray diffraction study in Cu2GeSe3

Authors :
Marcano, G.
Rincón, C.
Marín, G.
Delgado, G.E.
Mora, A.J.
Herrera-Pérez, J.L.
Mendoza-Alvarez, J.G.
Rodríguez, P.
Source :
Solid State Communications. Apr2008, Vol. 146 Issue 1/2, p65-68. 4p.
Publication Year :
2008

Abstract

Abstract: A combined study of X-ray diffraction data and micro-Raman scattering of Cu2GeSe3 is presented. From the analysis of the X-ray data it is confirmed that this compound crystallizes in an orthorhombic cell, space group . From Raman spectra, optical modes are identified and their possible symmetry assignments are suggested. Peaks at 212, 266 and 300 cm−1, tentatively assigned to B2 modes, agree well with those reported from infrared reflectivity. The most strong peak at 189 cm−1 which is only Raman active is assigned to one of the two A2 modes. Lines at 135, 235 and 254 cm−1 are attributed to A1 or B1 modes. The highest phonon frequency band, observed at 385 cm−1, probably comprises the remaining A2 mode and an overtone from the strong line at 189 cm−1. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00381098
Volume :
146
Issue :
1/2
Database :
Academic Search Index
Journal :
Solid State Communications
Publication Type :
Academic Journal
Accession number :
31306404
Full Text :
https://doi.org/10.1016/j.ssc.2008.01.018