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Study of the optical response of phase-change recording layer with zinc oxide nanostructured thin film.
- Source :
-
Journal of Microscopy . Mar2008, Vol. 229 Issue 3, p561-566. 6p. 1 Color Photograph, 3 Diagrams, 4 Graphs. - Publication Year :
- 2008
-
Abstract
- Recently, use of nanostructured materials as a near-field optical active layer has attracted a lot of interest. The non-linear optical properties and strong enhancements of metallic oxide nanostructured thin films are key functions in applications of promising nanophotonics. For the importance of ultra-high density optical data storage, we continue investigating the ultra-high density recording property of near-field optical disk consisting of zinc oxide (ZnO x) nanostructured thin film. A carrier-to-noise ratio above 38 dB at a recording mark size of 100 nm can be obtained in the ZnO x near-field optical disk by a DVD driver tester directly. In this article, we use an optical pump-probe system (static media tester) to measure the optical response of a phase-change recording layer (Ge2Sb2Te5) and demonstrate the high contrast of optical recording with a ZnO x nanostructured thin film in short pulse durations. Also, we investigate the dependence of writing power and the optical response in conventional re-writable recording layers and the phase-change material with ZnO x nanostructured thin film. [ABSTRACT FROM AUTHOR]
- Subjects :
- *THIN films
*NANOPHOTONICS
*OPTICAL disks
*METALLIC oxides
*OPTICAL disk drives
Subjects
Details
- Language :
- English
- ISSN :
- 00222720
- Volume :
- 229
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- Journal of Microscopy
- Publication Type :
- Academic Journal
- Accession number :
- 31243011
- Full Text :
- https://doi.org/10.1111/j.1365-2818.2008.01944.x