AS SOCs GROW, TEST-AND-MEASUREMENT INSTRUMENTS MOVE ON-CHIP.

The article discusses issues related to evaluating and calibrating system on chips (SOCs). According to the article, chip designers must be able to create autocalibration methods that can compensate critical circuits for process, voltage, temperature, impedance and noise variations while the chip is in use. William Orme, general manager of the CoreInsight debugging program at ARM, says that designers resisted adding to the core area for debug but eventually, in-core debug became cost-effective in the overall cost of the SOC. INSET: MEMS ACCELEROMETERS NEED INSTRUMENTATION, TOO.