Structural and chemical analysis of pulsed laser deposited Mg x Zn1−x O hexagonal (x =0.15,0.28) and cubic (x =0.85) thin films

Abstract: Hexagonal and cubic Mg x Zn1−x O thin films corresponding to optical band gaps of 3.52eV, 4eV and 6.42eV for x =0.15, 0.28 and 0.85 compositions were grown by pulsed laser deposition technique. The crystalline quality of the films was investigated by X-ray diffraction–rocking curve measurements and indicated a high degree of crystallinity with narrow FWHM’s of 0.21°–0.59°. Rutherford back scattering–channeling spectroscopy provides channeling yields of 7–14% indicating the good crystalline quality of the thin films. X-Ray photoelectron spectroscopy measurements clearly indicated different level of oxidation states of Mg and Zn. [Copyright &y& Elsevier]