Diffusion-induced recrystallization in silver–palladium layers

The interdiffusion of Pd–Ag thin film diffusion couples is investigated by transmission electron microscopy and X-ray diffractometry at a temperature of 723K. By comparison with calculated diffractograms, it is shown that a diffusion-induced recrystallization takes place, which produces a first generation of new grains with a dominant composition of 24.5at.% Pd inside the diffusion zone. [Copyright &y& Elsevier]