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Reconstructed (12, 2, 7) Si surface structure observed by scanning tunneling microscopy.
- Source :
-
Journal of Applied Physics . 1/15/2000, Vol. 87 Issue 2, p711. 6p. 4 Black and White Photographs, 3 Diagrams, 1 Chart. - Publication Year :
- 2000
-
Abstract
- Presents information on a study which examined a series of reconstructed high-index silicon surfaces using ultrahigh vacuum scanning tunneling microscopy. Experimental procedure; Results and discussion; Conclusions.
- Subjects :
- *SILICON
*SURFACES (Physics)
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 87
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 2699334
- Full Text :
- https://doi.org/10.1063/1.371930