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Investigation of moisture-induced failures of stacked-die package

Authors :
Kim, Hak Sung
Song, Ho Geon
Source :
Microelectronics Reliability. Sep2007, Vol. 47 Issue 9-11, p1673-1679. 7p.
Publication Year :
2007

Abstract

Abstract: The present work studies the moisture induced failures of a stacked-die package. The study includes various experimental tests to find the characteristics of constituent packaging materials such as interfacial strength, hygro-swelling property and vapor pressure, and a comprehensive finite element analysis integrating the effects of the hygro-swelling stress, the thermo-mechanical stress and the vapor pressure. Specifically, the vapor pressures with respect to the moisture concentration and the temperature in epoxy molding compound were characterized experimentally by combined TMA/TGA technique. In the numerical stress analysis, the interfacial delamination was newly simulated by applying a cohesive element modeling technique, in which a quadratic traction damage initiation law and an exponential displacement separation law were used. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00262714
Volume :
47
Issue :
9-11
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
26682412
Full Text :
https://doi.org/10.1016/j.microrel.2007.07.014