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Integration of prior knowledge of measurement noise in kernel density classification

Authors :
Li, Yunlei
de Ridder, Dick
Duin, Robert P.W.
Reinders, Marcel J.T.
Source :
Pattern Recognition. Jan2008, Vol. 41 Issue 1, p320-330. 11p.
Publication Year :
2008

Abstract

Abstract: Samples can be measured with different precisions and reliabilities in different experiments, or even within the same experiment. These varying levels of measurement noise may deteriorate the performance of a pattern recognition system, if not treated with care. Here we seek to investigate the benefit of incorporating prior knowledge about measurement noise into system construction. We propose a kernel density classifier which integrates such prior knowledge. Instead of using an identical kernel for each sample, we transform the prior knowledge into a distinct kernel for each sample. The integration procedure is straightforward and easy to interpret. In addition, we show how to estimate the diverse measurement noise levels in a real world dataset. Compared to the basic methods, the new kernel density classifier can give a significantly better classification performance. As expected, this improvement is more obvious for small sample size datasets and large number of features. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00313203
Volume :
41
Issue :
1
Database :
Academic Search Index
Journal :
Pattern Recognition
Publication Type :
Academic Journal
Accession number :
26334669
Full Text :
https://doi.org/10.1016/j.patcog.2007.05.005