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Point contact reactions between Ni and Si nanowires and reactive epitaxial growth of axial nano-NiSi/Si.

Authors :
Lu, Kuo-Chang
Tu, K. N.
Wu, W. W.
Chen, L. J.
Yoo, Bong-Young
Myung, Nosang V.
Source :
Applied Physics Letters. 6/18/2007, Vol. 90 Issue 25, p253111. 3p. 3 Diagrams, 1 Graph.
Publication Year :
2007

Abstract

Point contact reactions between a Si nanowire and a Ni nanowire are reported in which the Si nanowire is transformed into a single crystal NiSi with an epitaxial interface which has no misfit dislocation. The reactions were carried out in situ in an ultrahigh vacuum transmission electron microscope. The growth of the NiSi occurs by the dissolution of Ni into the Si nanowire and by interstitial diffusion from the point of contact to the epitaxial interface. The point contact reactions have enabled the authors to fabricate single crystal NiSi/Si/NiSi heterostructures of atomically sharp interfaces for nanoscale devices. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
90
Issue :
25
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
25638335
Full Text :
https://doi.org/10.1063/1.2750530