Cite
Characterization of multiscale surface evolution of polycrystalline copper thin films.
MLA
Yang, J. J., and K. W. Xu. “Characterization of Multiscale Surface Evolution of Polycrystalline Copper Thin Films.” Journal of Applied Physics, vol. 101, no. 10, May 2007, p. 104902. EBSCOhost, https://doi.org/10.1063/1.2732440.
APA
Yang, J. J., & Xu, K. W. (2007). Characterization of multiscale surface evolution of polycrystalline copper thin films. Journal of Applied Physics, 101(10), 104902. https://doi.org/10.1063/1.2732440
Chicago
Yang, J. J., and K. W. Xu. 2007. “Characterization of Multiscale Surface Evolution of Polycrystalline Copper Thin Films.” Journal of Applied Physics 101 (10): 104902. doi:10.1063/1.2732440.