Analysis of moiré data for near-interface cracks.

The analysis of moiré data obtained in bimaterials with near-interface cracks is examined. To extract stress intensity factors, a collocation-type method is developed where Westergaard crack-tip expansions are used for displacements in the cracked portion of the bimaterial, expansions from the method of fundamental solutions are used for displacements in the uncracked portion of the bimaterial, and continuity conditions at the interface are used to couple the two expansions. Proof-of-principle numerical experiments performed on synthetic data from a boundary element analysis of a cracked bimaterial successfully demonstrated the analysis method. Mixed-mode stress intensity factors were then determined from actual moiré data obtained in a copper–tungsten specimen. [ABSTRACT FROM AUTHOR]