Nanotopographical imaging using a heated atomic force microscope cantilever probe

MLA

Kim, K. J., et al. “Nanotopographical Imaging Using a Heated Atomic Force Microscope Cantilever Probe.” Sensors & Actuators A: Physical, vol. 136, no. 1, May 2007, pp. 95–103. EBSCOhost, https://doi.org/10.1016/j.sna.2006.10.052.

APA

Kim, K. J., Park, K., Lee, J., Zhang, Z. M., & King, W. P. (2007). Nanotopographical imaging using a heated atomic force microscope cantilever probe. Sensors & Actuators A: Physical, 136(1), 95–103. https://doi.org/10.1016/j.sna.2006.10.052

Chicago

Kim, K.J., K. Park, J. Lee, Z.M. Zhang, and W.P. King. 2007. “Nanotopographical Imaging Using a Heated Atomic Force Microscope Cantilever Probe.” Sensors & Actuators A: Physical 136 (1): 95–103. doi:10.1016/j.sna.2006.10.052.