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Interface analysis of InAs/GaSb superlattice grown by MBE
- Source :
-
Journal of Crystal Growth . Apr2007, Vol. 301-302, p889-892. 4p. - Publication Year :
- 2007
-
Abstract
- Abstract: We report on the structural characterization of short period type-II InAs/GaSb superlattices (SLs) adapted for mid-infrared detection. These structures, grown by molecular beam epitaxy (MBE) on n-type GaSb substrates, are made up of 10 InAs monolayers (MLs) and 10 GaSb MLs and a strain balanced condition is obtained by inserting an InSb ML at the interface between InAs and GaSb in each superlattice''s period. From cross-sectional transmission electron microscopy (TEM) measurements, the interface structure is analysed in detail. Very homogeneous and smooth InAs and GaSb layers all over a 50 periods SL structure are observed and high-resolution images bring out the InSb ML inserted between InAs and GaSb. Room temperature absorbance spectroscopy measurements have been performed on strain-compensated SLs including 50, 100, 300 and 400 periods, for a total absorption zone thickness of 0.32, 0.64, 1.92 and 2.56μm, respectively. The spectra display reproducible and well-defined features with an absorption coefficient varying between 2×103 and 4×103 cm−1 in the 3–5μm mid-infrared domain, a sign of high-quality samples suitable for detection. [Copyright &y& Elsevier]
- Subjects :
- *MOLECULAR beam epitaxy
*INDIUM arsenide
*GALLIUM compounds
*SUPERLATTICES
Subjects
Details
- Language :
- English
- ISSN :
- 00220248
- Volume :
- 301-302
- Database :
- Academic Search Index
- Journal :
- Journal of Crystal Growth
- Publication Type :
- Academic Journal
- Accession number :
- 24470214
- Full Text :
- https://doi.org/10.1016/j.jcrysgro.2006.11.284