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Interface analysis of InAs/GaSb superlattice grown by MBE

Authors :
Satpati, B.
Rodriguez, J.B.
Trampert, A.
Tournié, E.
Joullié, A.
Christol, P.
Source :
Journal of Crystal Growth. Apr2007, Vol. 301-302, p889-892. 4p.
Publication Year :
2007

Abstract

Abstract: We report on the structural characterization of short period type-II InAs/GaSb superlattices (SLs) adapted for mid-infrared detection. These structures, grown by molecular beam epitaxy (MBE) on n-type GaSb substrates, are made up of 10 InAs monolayers (MLs) and 10 GaSb MLs and a strain balanced condition is obtained by inserting an InSb ML at the interface between InAs and GaSb in each superlattice''s period. From cross-sectional transmission electron microscopy (TEM) measurements, the interface structure is analysed in detail. Very homogeneous and smooth InAs and GaSb layers all over a 50 periods SL structure are observed and high-resolution images bring out the InSb ML inserted between InAs and GaSb. Room temperature absorbance spectroscopy measurements have been performed on strain-compensated SLs including 50, 100, 300 and 400 periods, for a total absorption zone thickness of 0.32, 0.64, 1.92 and 2.56μm, respectively. The spectra display reproducible and well-defined features with an absorption coefficient varying between 2×103 and 4×103 cm−1 in the 3–5μm mid-infrared domain, a sign of high-quality samples suitable for detection. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00220248
Volume :
301-302
Database :
Academic Search Index
Journal :
Journal of Crystal Growth
Publication Type :
Academic Journal
Accession number :
24470214
Full Text :
https://doi.org/10.1016/j.jcrysgro.2006.11.284