Cite
Scaling and complexity drive LCD yield strategies.
MLA
Pye, Tom. “Scaling and Complexity Drive LCD Yield Strategies. (Cover Story).” Solid State Technology, vol. 50, no. 2, Feb. 2007, pp. 45–48. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=asx&AN=24336511&authtype=sso&custid=ns315887.
APA
Pye, T. (2007). Scaling and complexity drive LCD yield strategies. (Cover story). Solid State Technology, 50(2), 45–48.
Chicago
Pye, Tom. 2007. “Scaling and Complexity Drive LCD Yield Strategies. (Cover Story).” Solid State Technology 50 (2): 45–48. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=asx&AN=24336511&authtype=sso&custid=ns315887.