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Development of a New Silicon Drift Detector Module.
- Source :
-
AIP Conference Proceedings . 2007, Vol. 882 Issue 1, p917-919. 3p. 2 Diagrams, 2 Graphs. - Publication Year :
- 2007
-
Abstract
- A novel 7 cell Silicon Drift Detector (SDD) module for X-Ray Absorption Fine Structure Spectroscopy (XAFS) and similar methods is developed at the Hamburger Synchrotron Strahlungslabor at Deutsches Elektronen Synchrotron. The monolithic 7 cell SDD detector chips were delivered by PN Sensors (Munich, Germany). Each cell has an active area of 7 mm2. In this paper we report results from the spatially resolved spectroscopic characterization of the SDD and their consequences for the final design of the complete detector modules. A specialized read out chip is currently developed at DESY and will make it possible to achieve a maximum count rate of 600 Kcps/detector cell. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR]
- Subjects :
- *X-rays
*ELECTROMAGNETIC waves
*RADIATION
*SPECTRUM analysis
*ABSORPTION spectra
Subjects
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 882
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 24065249
- Full Text :
- https://doi.org/10.1063/1.2644704