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X-ray Pinpoint Structural Measurement for Nanomaterials and Devices at BL40XU of the SPring-8.
- Source :
-
AIP Conference Proceedings . 2007, Vol. 879 Issue 1, p1238-1241. 4p. 3 Diagrams, 1 Chart. - Publication Year :
- 2007
-
Abstract
- The pulse characteristic and high coherent x-ray beam of SPring-8 allow us to investigate dynamics of chemical reactions and phase transition of materials caused by applied field. In order to realize such direct investigation, “x-ray pinpoint structural measurement”, which is the advanced x-ray measurement technique in nanometer spatial scale and/or pico-second time scale, is being developed at SPring-8. The features of “x-ray pinpoint structural measurement” technique are, 1) spatial resolution: ∼ 100 nm, 2) time resolution: ∼ 40 ps, and 3) measurement under the photo-irradiation, electric field, magnetic field, high pressure and active devices. Using this technique, we will explore the novel concept and new phenomena for nanomaterials and/or devices, and also demonstrate their validity. © 2007 American Institute of Physics [ABSTRACT FROM AUTHOR]
- Subjects :
- *NANOTECHNOLOGY
*MAGNETIC fields
*X-rays
*CHEMICAL reactions
*PHASE transitions
Subjects
Details
- Language :
- English
- ISSN :
- 0094243X
- Volume :
- 879
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- AIP Conference Proceedings
- Publication Type :
- Conference
- Accession number :
- 23923746
- Full Text :
- https://doi.org/10.1063/1.2436288