Direct Measurement of SET Pulse Widths in 0.2-μm SOT Logic Cells Irradiated by Heavy Ions.

Heavy-ion-induced SET-pulse widths in NOR-logic cells fabricated by a 0.2-μm FD-SOI technology are directly measured by using an on-chip self-triggering Flip-Flop circuit. The pulse widths are distributed from 0.3 to 1.0 ns under a constant LET of 40 MeV · cm²/mg. [ABSTRACT FROM AUTHOR]