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Correction of X-Band Radar Observation for Propagation Effects Based on the Self-Consistency Principle.
- Source :
-
Journal of Atmospheric & Oceanic Technology . Dec2006, Vol. 23 Issue 12, p1668-1681. 14p. 8 Graphs. - Publication Year :
- 2006
-
Abstract
- New algorithms for rain attenuation correction of reflectivity factor and differential reflectivity are presented. Following the methodology suggested for the first time by Gorgucci et al., the new algorithms are developed based on the self-consistency principle, describing the interrelation between polarimetric measurements along the rain medium. There is an increasing interest in X-band radar systems, owing to the early success of the attenuation-correction procedures as well as the initiative of the Center for Collaborative Adaptive Sensing of the Atmosphere to deploy X-band radars in a networked fashion. In this paper, self-consistent algorithms for correcting attenuation and differential attenuation are developed. The performance of the algorithms for application to X-band dual-polarization radars is evaluated extensively. The evaluation is conducted based on X-band dual-polarization observations generated from S-band radar measurements. Evaluation of the new self-consistency algorithms shows significant improvement in performance compared to the current class of algorithms. In the case that reflectivity and differential reflectivity are calibrated between ±1 and ±0.2 dB, respectively, the new algorithms can estimate both attenuation and differential attenuation with less than 10% bias and 15% random error. In addition, the attenuation-corrected reflectivity and differential reflectivity are within 1–0.2 dB 96% and 99% of the time, respectively, demonstrating the good performance. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 07390572
- Volume :
- 23
- Issue :
- 12
- Database :
- Academic Search Index
- Journal :
- Journal of Atmospheric & Oceanic Technology
- Publication Type :
- Academic Journal
- Accession number :
- 23560362
- Full Text :
- https://doi.org/10.1175/JTECH1950.1