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Study on Fourier transforms profilometry based on bi-color projecting

Authors :
Chen, Wenjing
Bu, Peng
Zheng, Suzhen
Su, Xianyu
Source :
Optics & Laser Technology. Jun2007, Vol. 39 Issue 4, p821-827. 7p.
Publication Year :
2007

Abstract

Abstract: Projecting a bicolor sinusoidal fringe pattern consisting of two interlaced RGB format base color fringe patterns with π phase difference onto an object thought digital light projector, we can capture a deformed color pattern by color digital camera, then decode two individual sinusoidal fringe patterns with π phase difference by color-separating technique. Accessing these two fringe patterns, not only are zero-order spectra eliminated, but mask function is also built to mark valid unwrapping area in FTP, automatically. Moreover, because the wrapped phase just inside the valid areas is needed unwrapping, we can mark these areas with mask function, which avoids the error transferring resulting from unwrapping the invalid areas and shortens the unwrapping time. Furthermore, in Fourier transform processing, the full-field deformed fringe pattern generally needed to guarantee measurement precision can be formed by expanding non-full-field fringe pattern captured using the mask function. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00303992
Volume :
39
Issue :
4
Database :
Academic Search Index
Journal :
Optics & Laser Technology
Publication Type :
Academic Journal
Accession number :
23354303
Full Text :
https://doi.org/10.1016/j.optlastec.2006.02.002