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Well-orientated cubic boron nitride nanocrystals as studied by high-resolution transmission electron microscopy.
- Source :
-
Journal of Microscopy . Sep2006, Vol. 223 Issue 3, p205-207. 3p. 3 Diagrams. - Publication Year :
- 2006
-
Abstract
- In a boron nitride thin film, grown on a Si (100) substrate by radio frequency magnetron sputtering, a striking nanostructure is observed by high-resolution transmission electron microscopy. It consists of cubic boron nitride nanocrystals with a rather good triangular shape, pointing always to the substrate. The nanocrystals are usually highly defected and present their own interesting internal structure. Texture formation is observed within a nanocrystal, with all the subgrains observed to have a common <011> axis, which is also approximately parallel to a <011> axis of the Si substrate, i.e. the nanocrystals are very well structurally orientated in relation to the Si substrate (self-organized). Dislocations and stacking faults are also found in the nanocrystals. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00222720
- Volume :
- 223
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- Journal of Microscopy
- Publication Type :
- Academic Journal
- Accession number :
- 22765020
- Full Text :
- https://doi.org/10.1111/j.1365-2818.2006.01620.x