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Application of various optical techniques for ESD defect localization
- Source :
-
Microelectronics Reliability . Sep2006, Vol. 46 Issue 9-11, p1563-1568. 6p. - Publication Year :
- 2006
-
Abstract
- Abstract: Various optical defect localization techniques are applied on the same integrated circuits (IC). These circuits were previously stressed by Electro Static Discharges (ESD) to create defects. The results obtained by each technique were analyzed to determine the nature of the defects. The different data are compared to assess their sensitivity and to evaluate the contribution of each technique in a failure analysis flow. [Copyright &y& Elsevier]
- Subjects :
- *INTEGRATED circuits
*ELECTRONIC circuits
*MICROELECTRONICS
*ELECTRONICS
Subjects
Details
- Language :
- English
- ISSN :
- 00262714
- Volume :
- 46
- Issue :
- 9-11
- Database :
- Academic Search Index
- Journal :
- Microelectronics Reliability
- Publication Type :
- Academic Journal
- Accession number :
- 22135767
- Full Text :
- https://doi.org/10.1016/j.microrel.2006.07.021