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Study of structure and magnetic properties of Ni-doped ZnO-based DMSs

Authors :
Li, B.B.
Xiu, X.Q.
Zhang, R.
Tao, Z.K.
Chen, L.
Xie, Z.L.
Zheng, Y.D.
Xie, Z.
Source :
Materials Science in Semiconductor Processing. Feb2006, Vol. 9 Issue 1-3, p141-145. 5p.
Publication Year :
2006

Abstract

Abstract: Zn1− x Ni x O (, 0.02 and 0.05) powders were prepared by a sol–gel method. We have studied the structure and magnetic properties of the samples by using X-ray diffraction (XRD), Raman scattering, superconducting quantum interference device (SQUID) and extended X-ray absorption fine structure (EXAFS). The SQUID results showed that all the samples exhibit ferromagnetism above room temperature. From the XRD spectra of the samples, it was obvious that there had no second phase while the Ni-doped concentration was lower than 5at%. Raman spectra showed an additional band, which is related to the vibration of Ni dopant. The EXAFS was used for the Ni K-edge to probe the local structures of the Ni dopant in ZnO, which show that Ni dopant was substituted for Zn atoms position up to 5at% Ni concentration. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
13698001
Volume :
9
Issue :
1-3
Database :
Academic Search Index
Journal :
Materials Science in Semiconductor Processing
Publication Type :
Academic Journal
Accession number :
21284239
Full Text :
https://doi.org/10.1016/j.mssp.2006.01.074