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Tracking with Heavily Irradiated Silicon Detectors Operated at Cryogenic Temperatures.
- Source :
-
IEEE Transactions on Nuclear Science . Jun99 Part 1 of 3, Vol. 46 Issue 3, p228. 4p. 1 Diagram, 5 Graphs. - Publication Year :
- 1999
-
Abstract
- Presents information on a study which discussed tracking of charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures. Details on Lazarus effect; Description of irradiated microstrip tracker; Results of the study; Conclusion.
- Subjects :
- *SILICON diodes
*CRYOELECTRONICS
*STRIP transmission lines
*RADIATION
Subjects
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 46
- Issue :
- 3
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 2104346
- Full Text :
- https://doi.org/10.1109/23.775519