Cite
In situ synchrotron radiation grazing incidence X-ray diffraction—A powerful technique for the characterization of solid-state ion-selective electrode surfaces
MLA
De Marco, Roland, et al. “In Situ Synchrotron Radiation Grazing Incidence X-Ray Diffraction—A Powerful Technique for the Characterization of Solid-State Ion-Selective Electrode Surfaces.” Electrochimica Acta, vol. 51, no. 23, June 2006, pp. 4886–91. EBSCOhost, https://doi.org/10.1016/j.electacta.2006.01.034.
APA
De Marco, R., Jiang, Z.-T., Pejcic, B., & van Riessen, A. (2006). In situ synchrotron radiation grazing incidence X-ray diffraction—A powerful technique for the characterization of solid-state ion-selective electrode surfaces. Electrochimica Acta, 51(23), 4886–4891. https://doi.org/10.1016/j.electacta.2006.01.034
Chicago
De Marco, Roland, Zhong-Tao Jiang, Bobby Pejcic, and Arie van Riessen. 2006. “In Situ Synchrotron Radiation Grazing Incidence X-Ray Diffraction—A Powerful Technique for the Characterization of Solid-State Ion-Selective Electrode Surfaces.” Electrochimica Acta 51 (23): 4886–91. doi:10.1016/j.electacta.2006.01.034.