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Temperature dependence of DC characteristics of NpN InP/GaAsSb/InP double heterojunction bipolar transistors: an analytical study

Authors :
Tian, Yuan
Wang, Hong
Source :
Microelectronics Journal. Jul2006, Vol. 37 Issue 7, p595-600. 6p.
Publication Year :
2006

Abstract

Abstract: An analytic study of DC characteristics based on the drift-diffusion approach has been performed for the InP/GaAsSb DHBTs. The current transport of InP/GaAsSb/InP DHBTs has been investigated focusing the device temperature dependence. Our simulation results show that, at room temperature, the DC characteristics of the InP/GaAsSb/InP DHBTs similar to the conventional InP-based HBT using InGaAs as the base layer although a type-II energy band alignment is presented in the InP/GaAsSb HBT. However, due to different mechanisms for the electron injection from the emitter induced by the different conduction band alignments, the InP/GaAsSb HBTs may present a different temperature dependent behavior in term of device current gain as compared to the conventional InP/InGaAs HBTs. Higher current gain could be achieved by the InP/GaAsSb HBTs at elevated temperature. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00262692
Volume :
37
Issue :
7
Database :
Academic Search Index
Journal :
Microelectronics Journal
Publication Type :
Academic Journal
Accession number :
20823719
Full Text :
https://doi.org/10.1016/j.mejo.2005.09.004