Cite
Hope seen for taming IC process variability at next design node.
MLA
Goering, Richard. “Hope Seen for Taming IC Process Variability at next Design Node.” Electronic Engineering Times (01921541), no. 1419, Apr. 2006, pp. 1–12. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=asx&AN=20720039&authtype=sso&custid=ns315887.
APA
Goering, R. (2006). Hope seen for taming IC process variability at next design node. Electronic Engineering Times (01921541), 1419, 1–12.
Chicago
Goering, Richard. 2006. “Hope Seen for Taming IC Process Variability at next Design Node.” Electronic Engineering Times (01921541), no. 1419 (April): 1–12. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=asx&AN=20720039&authtype=sso&custid=ns315887.