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A Micrometric Thickness Silicon Diode Proposed as a Microdosimeter.

Authors :
Fazzi, Alberto
Agosteo, Stefano
Pola, Andrea
Varoli, Vincenzo
Zotto, Pierluigi
Source :
IEEE Transactions on Nuclear Science. Feb2006 Part 2, Vol. 53 Issue 1, p312-316. 5p. 2 Diagrams, 12 Graphs.
Publication Year :
2006

Abstract

A thin silicon diode formed by a deep p+ implantation under a shallow n+ one is proposed as a solid state micro- dosimeter. The thickness of the sensitive layer of the tested device is about two micrometers and the active area is about 10 mm². Due to the very large electric capacitance of the diode (about 1 nF) a low noise read-out circuit based on a discrete JFET has been developed. The noise due to the parasitic resistance of the detector itself dominates and fixes the lower threshold of the energy spectrum. A prototype of the proposed microdosimeter covered with a polyethylene converter has been irradiated with fast monoenergetic neutrons at the INFN-Legnaro Labs (I). The first experimental spectra are in good agreement with the simulated ones. The effect of direct inter- actions of thermal neutrons in silicon has been measured. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189499
Volume :
53
Issue :
1
Database :
Academic Search Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
20451398
Full Text :
https://doi.org/10.1109/TNS.2006.869832