Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structure.

MLA

Sun, C. J., et al. “Investigation of Phase Miscibility of CoCrPt Thin Films Using Anomalous X-Ray Scattering and Extended x-Ray Absorption Fine Structure.” Applied Physics Letters, vol. 88, no. 12, Mar. 2006, p. 122508. EBSCOhost, https://doi.org/10.1063/1.2188041.

APA

Sun, C. J., Chow, G. M., Han, S.-W., Wang, J. P., Hwu, Y. K., & Je, J. H. (2006). Investigation of phase miscibility of CoCrPt thin films using anomalous x-ray scattering and extended x-ray absorption fine structure. Applied Physics Letters, 88(12), 122508. https://doi.org/10.1063/1.2188041

Chicago

Sun, C. J., G. M. Chow, S.-W. Han, J. P. Wang, Y. K. Hwu, and J. H. Je. 2006. “Investigation of Phase Miscibility of CoCrPt Thin Films Using Anomalous X-Ray Scattering and Extended x-Ray Absorption Fine Structure.” Applied Physics Letters 88 (12): 122508. doi:10.1063/1.2188041.