Potential Drop Spectroscopy for Characterization of Complex Defects.

Branched or multiple defects are encountered in many industrial applications, but sizing is often difficult because of their complex geometry. Potential Drop (PD) Spectroscopy seems to be a promising solution, as it combines measurements at different frequencies to define the envelope of a defect, which allows the maximum depth to be determined. The predictions of simple two-dimensional finite-element models have been confirmed by the results of three-dimensional experimental measurements on specimens with simple defects. © 2006 American Institute of Physics [ABSTRACT FROM AUTHOR]