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New Methodology for Combined Simulation of Delta-I Noise Interaction With Interconnect Noise for Wide, On-Chip Data-Buses Using Lossy Transmission-Line Power-Blocks.
- Source :
-
IEEE Transactions on Advanced Packaging . Feb2006, Vol. 29 Issue 1, p11-20. 10p. - Publication Year :
- 2006
-
Abstract
- A new technique is described for reducing computational complexity and improving accuracy of combined power distribution and interconnect noise prediction for wide, on-chip data-buses. The methodology uses lossy transmission-line power-blocks with frequency-dependent properties needed for the multigigahertz clock frequencies. The interaction between delta-I noise, common-mode noise, and crosstalk and their effect on timing is illustrated with simulations using representative driver and receiver circuits and on-chip interconnections. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 15213323
- Volume :
- 29
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Advanced Packaging
- Publication Type :
- Academic Journal
- Accession number :
- 19955910
- Full Text :
- https://doi.org/10.1109/TADVP.2005.862647