Back to Search Start Over

New Methodology for Combined Simulation of Delta-I Noise Interaction With Interconnect Noise for Wide, On-Chip Data-Buses Using Lossy Transmission-Line Power-Blocks.

Authors :
Deutsch, Alina
Smith, Howard H.
Rubin, Barry J.
Krauter, Byron L.
Kopcsay, Gerard V.
Source :
IEEE Transactions on Advanced Packaging. Feb2006, Vol. 29 Issue 1, p11-20. 10p.
Publication Year :
2006

Abstract

A new technique is described for reducing computational complexity and improving accuracy of combined power distribution and interconnect noise prediction for wide, on-chip data-buses. The methodology uses lossy transmission-line power-blocks with frequency-dependent properties needed for the multigigahertz clock frequencies. The interaction between delta-I noise, common-mode noise, and crosstalk and their effect on timing is illustrated with simulations using representative driver and receiver circuits and on-chip interconnections. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
15213323
Volume :
29
Issue :
1
Database :
Academic Search Index
Journal :
IEEE Transactions on Advanced Packaging
Publication Type :
Academic Journal
Accession number :
19955910
Full Text :
https://doi.org/10.1109/TADVP.2005.862647