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Commercial TMR Heads for Hard Disk Drives: Characterization and Extendibility At 300 Gbit/in2.

Authors :
Mao, Sining
Chen, Yonghua
Liu, Feng
Chen, Xingfu
Xu, Bin
Lu, Puling
Patwari, Mohammed
Xi, Haiwen
Clif Chang
Miller, Brad
Menard, Dave
Pant, Bharat
Loven, Jay
Duxstad, Kristin
Li, Shaoping
Zhang, Zhengyong
Johnston, Alan
Lamberton, Robert
Gubbins, Mark
Mclaughlin, Tom
Source :
IEEE Transactions on Magnetics. Feb2006 Part 1, Vol. 42 Issue 2, p97-102. 6p.
Publication Year :
2006

Abstract

Tunneling magnetoresistive (TMR) reading heads at an areal density of 80-100 Gbit/in² in a longitudinal magnetic recording mode have for the first time been commercialized for both laptop and desktop Seagate hard disk drive products. The first generation TMR products utilized a bottom TMR stack and an abutted hard bias design. These TMR heads have demonstrated three times the amplitude of comparable giant magnetoresistive (GMR) devices, resulting in a 0.6 decade bit error rate gain over GMR. This has enabled high component and drive yields. Due to the improved thermal dissipation of current-perpendicular-to-plane geometry, TMR runs cooler and has better lifetime performance, and has demonstrated the similar electrical static discharge robustness as GMR. TMR has demonstrated equivalent or better process and wafer yields compared to GMR. The TMR heads is proven to be a mature and capable reader technology. Using the same TMR head design in conjunction with perpendicular recording, 274 Gbitfin2 has been demonstrated. Advanced design can reach 311 Gbit/in² [ABSTRACT FROM AUTHOR]

Details

Language :
Turkish
ISSN :
00189464
Volume :
42
Issue :
2
Database :
Academic Search Index
Journal :
IEEE Transactions on Magnetics
Publication Type :
Academic Journal
Accession number :
19935764
Full Text :
https://doi.org/10.1109/TMAG.2005.861788