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Dopant source choice for formation of p-type ZnO: Li acceptor.

Authors :
Zeng, Y. J.
Ye, Z. Z.
Xu, W. Z.
Li, D. Y.
Lu, J. G.
Zhu, L. P.
Zhao, B. H.
Source :
Applied Physics Letters. 2/6/2006, Vol. 88 Issue 6, p062107. 3p. 1 Chart, 5 Graphs.
Publication Year :
2006

Abstract

Li-doped, p-type ZnO thin films have been realized via dc reactive magnetron sputtering. An optimized result with a resistivity of 16.4 Ω cm, Hall mobility of 2.65 cm2/V s, and hole concentration of 1.44×1017 cm-3 was achieved, and electrically stable over a month. Hall-effect measurements supported by secondary ion mass spectroscopy indicated that the substrate temperature played a key role in optimizing the p-type conduction of Li-doped ZnO thin films. Furthermore, ZnO-based p-n homojunction was fabricated by deposition of a Li-doped p-type ZnO layer on an Al-doped n-type ZnO layer. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
88
Issue :
6
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
19933707
Full Text :
https://doi.org/10.1063/1.2172743