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Comparison of valence band x-ray photoelectron spectrum between Al–N-codoped and N-doped ZnO films.
- Source :
-
Applied Physics Letters . 2/6/2006, Vol. 88 Issue 6, p062110. 3p. 1 Chart, 3 Graphs. - Publication Year :
- 2006
-
Abstract
- The valence band structures of Al–N-codoped [ZnO:(Al, N)] and N-doped (ZnO:N) ZnO films were studied by normal and soft x-ray photoelectron spectroscopy. The valence-band maximum of ZnO:(Al, N) shifts up to Fermi energy level by about 300 meV compared with that of ZnO:N. Such a shift can be attributed to the existence of a kind of Al–N in ZnO:(Al, N), as supported by core level XPS spectra and comparison of modified Auger parameters. Al–N increased the relative quantity of Zn–N in ZnO:(Al, N), while N–N decreased that of Zn–N in ZnO:N. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 88
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 19933704
- Full Text :
- https://doi.org/10.1063/1.2171804