Cite
Optimal periodic testing policy for circuit with self-testing
MLA
Mizutani, Satoshi, et al. “Optimal Periodic Testing Policy for Circuit with Self-Testing.” Computers & Mathematics with Applications, vol. 51, no. 2, Jan. 2006, pp. 363–70. EBSCOhost, https://doi.org/10.1016/j.camwa.2005.11.025.
APA
Mizutani, S., Nakagawa, T., Ito, K., & Sandoh, H. (2006). Optimal periodic testing policy for circuit with self-testing. Computers & Mathematics with Applications, 51(2), 363–370. https://doi.org/10.1016/j.camwa.2005.11.025
Chicago
Mizutani, Satoshi, Toshio Nakagawa, Kodo Ito, and Hiroaki Sandoh. 2006. “Optimal Periodic Testing Policy for Circuit with Self-Testing.” Computers & Mathematics with Applications 51 (2): 363–70. doi:10.1016/j.camwa.2005.11.025.