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Semiconductor physics: Transport news.

Authors :
Boland, John J.
Source :
Nature. 2/9/2006, Vol. 439 Issue 7077, p671-673. 3p.
Publication Year :
2006

Abstract

The article presents a study which revealed the impact of the surface effects in thin silicon films on the transport of charge carriers and on device performance. The result was considered as a new opportunity for device physics. Researchers added that the position of the Fermi energy is still controlled during silicon doping. Thus, a need to develop a high-resolution technique for the implantation of dopant ions on semiconductor materials is needed.

Details

Language :
English
ISSN :
00280836
Volume :
439
Issue :
7077
Database :
Academic Search Index
Journal :
Nature
Publication Type :
Academic Journal
Accession number :
19722141
Full Text :
https://doi.org/10.1038/439671a