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Charge collection in submicron CMOS/SOI technology.
- Source :
-
IEEE Transactions on Nuclear Science . Dec97 Part 1 of 3, Vol. 44 Issue 6, p2124. 10p. 1 Diagram, 4 Charts, 8 Graphs. - Publication Year :
- 1997
-
Abstract
- Examines the measurements of charge collection spectroscopy in submicron CMOS/SOI devices. Reference to the bipolar mechanism; Presentation of experimental measurement of charge collection spectroscopy.
- Subjects :
- *SPECTRUM analysis
Subjects
Details
- Language :
- English
- ISSN :
- 00189499
- Volume :
- 44
- Issue :
- 6
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Nuclear Science
- Publication Type :
- Academic Journal
- Accession number :
- 19666
- Full Text :
- https://doi.org/10.1109/23.659027