Back to Search Start Over

Ion implantation inducing nanovoids characterized by TEM and STEM

Authors :
Xiao, Xiangheng
Jiang, Changzhong
Ren, Feng
Wang, Jianbo
Shi, Ying
Source :
Solid State Communications. Feb2006, Vol. 137 Issue 7, p362-365. 4p.
Publication Year :
2006

Abstract

Abstract: The evolution of nanoparticles in sequentially ion-implanted Ag and Ag/Cu into silica glasses has been studied. The doses for implantation (×1016 ions/cm2) were 5Ag, 5Ag/5Cu and 5Ag/15Cu. Ag nanoclusters have been formed in the implanted 5Ag specimen. In the implanted 5Ag/5Cu specimen, some formed nanoclusters have brighter center features. With an increase of Cu ions dose, the nanoclusters with brighter center features become prevalent. The microstructural properties of the nanoparticles are characterized by transmission electron microscopy. Scanning transmission electron microscope high-angle annular dark field and high-resolution transmission electron microscopy are also utilized to study the formed nanoparticles. The results show that nanovoids have been induced into metal nanoparticles during the ion implanting process, not the core-shell nanoparticles as other workers believed. The nanovoids can be the aggregation of vacancies induced by irradiation. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00381098
Volume :
137
Issue :
7
Database :
Academic Search Index
Journal :
Solid State Communications
Publication Type :
Academic Journal
Accession number :
19607832
Full Text :
https://doi.org/10.1016/j.ssc.2005.12.016