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Measurement of Zn0.95Cd0.05O/ZnO (0001) heterojunction band offsets by x-ray photoelectron spectroscopy.
- Source :
-
Applied Physics Letters . 11/7/2005, Vol. 87 Issue 19, p192106. 3p. 1 Diagram, 1 Chart, 2 Graphs. - Publication Year :
- 2005
-
Abstract
- X-ray photoelectron spectroscopy was used to measure the energy discontinuity in the valence band (ΔEv) of Zn0.95Cd0.05O/ZnO heterostructures grown by rf plasma-enhanced molecular-beam epitaxy. A value of ΔEv=0.17±0.03 eV was obtained by using the Zn 2p energy level as a reference. Given the experimental band gap of 2.9 eV for the Zn0.95Cd0.05O, this would indicate a conduction band offset ΔEC of 0.30 eV in this system. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 87
- Issue :
- 19
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 19106012
- Full Text :
- https://doi.org/10.1063/1.2128477