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Compact Tester Available In Three Configurations.
- Source :
-
EE: Evaluation Engineering . Oct2005, Vol. 44 Issue 10, p10-10. 1/4p. 1 Color Photograph. - Publication Year :
- 2005
-
Abstract
- Evaluates the IC-100 integrated circuit test system from ProductionLine Testers. Configurations; Features; Price.
- Subjects :
- *TEST systems
*INTEGRATED circuits
*TESTING equipment
*ELECTRONIC circuits
Subjects
Details
- Language :
- English
- ISSN :
- 01490370
- Volume :
- 44
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- EE: Evaluation Engineering
- Publication Type :
- Periodical
- Accession number :
- 18492081