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Controlling carrier density and its effect on I–V characteristics of the anatase–TiO2 thin films prepared by a sputter deposition method
- Source :
-
Thin Solid Films . Jul2005, Vol. 483 Issue 1/2, p147-151. 5p. - Publication Year :
- 2005
-
Abstract
- Abstract: TiO2 thin films were prepared by the inductively coupled Ar+-plasma sputtering method. The effects of O2 partial pressure on photoelectrochemical performance of the mainly anatase–TiO2 electrodes were studied. O2 partial pressure systematically affected the carrier density and the current–voltage characteristics of the electrodes. An electrode deposited at lowest O2 partial pressure (11 mPa) showed almost 3 orders of magnitude greater donor density and 4 times larger photocurrent compared to the one deposited at highest O2 partial pressure (52 mPa). The differences in current–voltage characteristics of the electrode samples are discussed on the basis of the space charge layer formation in the electrodes with different carrier densities. [Copyright &y& Elsevier]
- Subjects :
- *THIN films
*ELECTRODES
*SOLID state electronics
*THICK films
Subjects
Details
- Language :
- English
- ISSN :
- 00406090
- Volume :
- 483
- Issue :
- 1/2
- Database :
- Academic Search Index
- Journal :
- Thin Solid Films
- Publication Type :
- Academic Journal
- Accession number :
- 18479187
- Full Text :
- https://doi.org/10.1016/j.tsf.2005.01.001