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Geminate charge recombination with distance-dependent intrinsic reaction rate: Escape probability and its electric field effect

Authors :
Wojcik, Mariusz
Tachiya, M.
Source :
Radiation Physics & Chemistry. Oct2005, Vol. 74 Issue 3/4, p132-138. 7p.
Publication Year :
2005

Abstract

Abstract: We calculate the electric field dependence of the probability of escape from geminate recombination in the case of a finite, distance-dependent intrinsic reaction rate. We solve a partial differential equation for the escape probability using a numerical method. We assess the role of finite-reactivity effects in geminate recombination and discuss their possible consequences for interpretation of experimental data. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
0969806X
Volume :
74
Issue :
3/4
Database :
Academic Search Index
Journal :
Radiation Physics & Chemistry
Publication Type :
Academic Journal
Accession number :
18257623
Full Text :
https://doi.org/10.1016/j.radphyschem.2005.04.005