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Geminate charge recombination with distance-dependent intrinsic reaction rate: Escape probability and its electric field effect
- Source :
-
Radiation Physics & Chemistry . Oct2005, Vol. 74 Issue 3/4, p132-138. 7p. - Publication Year :
- 2005
-
Abstract
- Abstract: We calculate the electric field dependence of the probability of escape from geminate recombination in the case of a finite, distance-dependent intrinsic reaction rate. We solve a partial differential equation for the escape probability using a numerical method. We assess the role of finite-reactivity effects in geminate recombination and discuss their possible consequences for interpretation of experimental data. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 0969806X
- Volume :
- 74
- Issue :
- 3/4
- Database :
- Academic Search Index
- Journal :
- Radiation Physics & Chemistry
- Publication Type :
- Academic Journal
- Accession number :
- 18257623
- Full Text :
- https://doi.org/10.1016/j.radphyschem.2005.04.005