GAN augmented phase noise modeling of PLL for use in automated testing.

MLA

Panigrahi, Jayanta Kumar, and Debiprasad Priyabrata Acharya. “GAN Augmented Phase Noise Modeling of PLL for Use in Automated Testing.” International Journal of Electronics Letters, Jan. 2025, pp. 1–8. EBSCOhost, https://doi.org/10.1080/21681724.2025.2453916.

APA

Panigrahi, J. K., & Acharya, D. P. (2025). GAN augmented phase noise modeling of PLL for use in automated testing. International Journal of Electronics Letters, 1–8. https://doi.org/10.1080/21681724.2025.2453916

Chicago

Panigrahi, Jayanta Kumar, and Debiprasad Priyabrata Acharya. 2025. “GAN Augmented Phase Noise Modeling of PLL for Use in Automated Testing.” International Journal of Electronics Letters, January, 1–8. doi:10.1080/21681724.2025.2453916.