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Feedback supported isolation structure for blocking of minority leakage carriers in power integrated circuits

Authors :
Starke, T.K.H.
Igic, P.
Source :
Microelectronics Journal. Aug2005, Vol. 36 Issue 8, p729-731. 3p.
Publication Year :
2005

Abstract

Abstract: A combination of two conventional junction isolation structures is used to produce a device, which significantly improves the blocking of minority carriers injected into the substrate of a power IC due to switching of an inductive load. Simulation results show that the connection scheme employed greatly enhances the efficiency of the structures. A substrate current reduction of up to four orders of magnitude compared to conventional junction isolation structures is achieved. The significance of doping profiles in the p-sinker region is evaluated. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00262692
Volume :
36
Issue :
8
Database :
Academic Search Index
Journal :
Microelectronics Journal
Publication Type :
Academic Journal
Accession number :
18195394
Full Text :
https://doi.org/10.1016/j.mejo.2004.11.002