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Feedback supported isolation structure for blocking of minority leakage carriers in power integrated circuits
- Source :
-
Microelectronics Journal . Aug2005, Vol. 36 Issue 8, p729-731. 3p. - Publication Year :
- 2005
-
Abstract
- Abstract: A combination of two conventional junction isolation structures is used to produce a device, which significantly improves the blocking of minority carriers injected into the substrate of a power IC due to switching of an inductive load. Simulation results show that the connection scheme employed greatly enhances the efficiency of the structures. A substrate current reduction of up to four orders of magnitude compared to conventional junction isolation structures is achieved. The significance of doping profiles in the p-sinker region is evaluated. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 00262692
- Volume :
- 36
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- Microelectronics Journal
- Publication Type :
- Academic Journal
- Accession number :
- 18195394
- Full Text :
- https://doi.org/10.1016/j.mejo.2004.11.002