Correlation of interface structure and optical properties of Ga(N,As) and Ga(As,Bi) based type-II hetero structures.

• Ga(N,As) and Ga(As,Bi) based type-II structures for long wavelength emission on GaAs substrates. • MOVPE grown samples investigated by photoluminescence spectroscopy, high-resolution X-ray diffraction, atomic force microscopy and scanning transmission electron microscopy. • Impact of different interface configurations: Ga(N,As) on Ga(As,Bi), Ga(As,Bi) on Ga(N,As) and with a GaAs interlayer. • Scanning transmission electron microscopy shows enhanced segregation if Ga(As,Bi) is grown on Ga(N,As) instead of GaAs. The type-II band alignment of particular III/V heterostructures is a promising route towards achieving certain wavelengths on specific substrates, which would not be possible with type-I structures. One example is telecommunication lasers on GaAs substrates. This study reports on the progress in combining dilute nitrides and dilute bismides in W-type hetero structures to improve the luminescence intensity, which is a fundamental prerequisite for future incorporation in a laser structure. Increasing the emission wavelength of these structures is challenging and the interface formation is critical, especially as two metastable materials are combined. Here, we investigate the impact of different interface configurations by growing Ga(N,As)/Ga(As,Bi) and Ga(As,Bi)/Ga(N,As) type-II structures. We employ metal–organic vapor phase epitaxy (MOVPE) to grow Ga(N,As) and Ga(As,Bi) layers and investigate the effects of interlayer thicknesses on the structural and optical properties of the hetero structures. The results indicate that − while the introduction of a GaAs interlayer can affect the direct and indirect transitions intensities − it does not significantly improve the interface quality. However, this is strongly influenced by the order in which the materials are grown. The growth of Ga(N,As) on Ga(As,Bi) shows no peculiarities, while the type II transition energy is shifted to lower energies when Ga(As,Bi) is grown on Ga(N,As). High-resolution X-ray diffraction (HR-XRD), photoluminescence (PL) spectroscopy, atomic force microscopy (AFM), and scanning transmission electron microscopy (STEM) were used to characterize the samples. [ABSTRACT FROM AUTHOR]