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Understanding and Circumventing Failure Mechanisms in Chalcogenide Optical Phase Change Material Ge2Sb2Se4Te.

Authors :
Popescu, Cosmin Constantin
Aryana, Kiumars
Mills, Brian
Lee, Tae Woo
Martin‐Monier, Louis
Ranno, Luigi
Sia, Jia Xu Brian
Dao, Khoi Phuong
Bae, Hyung‐Bin
Liberman, Vladimir
Vitale, Steven A.
Kang, Myungkoo
Richardson, Kathleen A.
Ríos Ocampo, Carlos A.
Calahan, Dennis
Zhang, Yifei
Humphreys, William M.
Kim, Hyun Jung
Gu, Tian
Hu, Juejun
Source :
Advanced Optical Materials. Nov2024, p1. 10p. 7 Illustrations.
Publication Year :
2024

Abstract

Chalcogenide optical phase change materials (PCMs) have garnered significant interest for their growing applications in programmable photonics, optical analog computing, active metasurfaces, and beyond. Limited endurance or cycling lifetime is however increasingly becoming a bottleneck toward their practical deployment for these applications. To address this issue, a systematic study elucidating the cycling failure mechanisms of Ge2Sb2Se4Te (GSST) is performed, a common optical PCM tailored for infrared photonic applications, in an electrothermal switching configuration commensurate with their applications in on‐chip photonic devices. Further a set of design rules building on insights into the failure mechanisms is proposed, and successfully implemented them to boost the endurance of the Ge2Sb2Se4Te (GSST) device to over 67 000 cycles. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
21951071
Database :
Academic Search Index
Journal :
Advanced Optical Materials
Publication Type :
Academic Journal
Accession number :
181182909
Full Text :
https://doi.org/10.1002/adom.202402751