Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring.

MLA

Feng, Xuefeng, et al. “Reliability Inference for Dual Constant-Stress Accelerated Life Test with Exponential Distribution and Progressively Type-II Censoring.” Journal of Statistical Computation & Simulation, vol. 94, no. 17, Nov. 2024, pp. 3864–91. EBSCOhost, https://doi.org/10.1080/00949655.2024.2405848.

APA

Feng, X., Tang, J., Balakrishnan, N., & Tan, Q. (2024). Reliability inference for dual constant-stress accelerated life test with exponential distribution and progressively Type-II censoring. Journal of Statistical Computation & Simulation, 94(17), 3864–3891. https://doi.org/10.1080/00949655.2024.2405848

Chicago

Feng, Xuefeng, Jiayin Tang, N. Balakrishnan, and Qitao Tan. 2024. “Reliability Inference for Dual Constant-Stress Accelerated Life Test with Exponential Distribution and Progressively Type-II Censoring.” Journal of Statistical Computation & Simulation 94 (17): 3864–91. doi:10.1080/00949655.2024.2405848.