Study of the physical nature of Mn4Si7 crystals formed by the diffusion method using an X-ray diffraction.

• The size of Mn 4 Si 7 crystals (D) ranged from 6.2∙10−10 m to 9.1∙10−8 m. • Lattice strain between crystal atoms (ε) from 0.31 to 3.71. • The dislocation density on the crystal surface (δ) is from 1∙1011 to 3.2∙1014. • The degree of crystallization of Mn 4 Si 7 is 9.3 %, the degree of amorphism is 90.7 %. Mn 4 Si 7 silicide crystals obtained by the diffusion method were studied using an X-ray diffractometer (XRD-6100) SHIMADZU. As a result of research, 14 peaks were identified in the Mn 4 Si 7 crystal, corresponding to the database (COD-1530134).The size of Mn 4 Si 7 silicide crystals (D Diff) ranged from 6.2 × 10−10 m to 9.1 × 10−8 m, the lattice tension between crystal atoms (ε Diff) from 0.31 to 3.71, the dislocation density on the surface (δ Diff) varied in the range from 1 × 1011 to 3.2 × 1014. It was found that the degree of crystallization of Mn 4 Si 7 was 9.3 %, and the degree of amorphism reached 90.7 %. It has been established that the degree of crystallization of Mn 4 Si 7 silicides is relatively low due to the fact that the Mn and Si atoms are non-stoichiometrically bonded to each other, and the degree of amorphism is high. [ABSTRACT FROM AUTHOR]